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Browsing by Author "Qu, N."

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    Characterization and modeling of transient device behavior under CMD ESD stress

    Willemen, J.
    ;
    Andreini, A.
    ;
    De Heyn, Vincent  
    ;
    Esmark, K.
    ;
    Etherton, M.
    ;
    Gieser, H.
    Journal article
    2004, Journal of Electrostatics, (62) 2_3, p.133-153

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