Publication:

Characterization and modeling of transient device behavior under CMD ESD stress

Date

2004
Journal article
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Author(s)

Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent  
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
;
Groeseneken, Guido  
;
Mettler, S.
;
Morena, E.
;
Qu, N.
;
Soppa, W.
;
Stadler, W.
;
Stella, R.
;
Wilkening, W.
;
Wolf, H.
;
Zullino, L.

Journal

Journal of Electrostatics

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1898 since deposited on 2021-10-15
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1898 since deposited on 2021-10-15
Acq. date: 2026-03-17

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