Publication:
Characterization and modeling of transient device behavior under CMD ESD stress
Date
| dc.contributor.author | Willemen, J. | |
| dc.contributor.author | Andreini, A. | |
| dc.contributor.author | De Heyn, Vincent | |
| dc.contributor.author | Esmark, K. | |
| dc.contributor.author | Etherton, M. | |
| dc.contributor.author | Gieser, H. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Mettler, S. | |
| dc.contributor.author | Morena, E. | |
| dc.contributor.author | Qu, N. | |
| dc.contributor.author | Soppa, W. | |
| dc.contributor.author | Stadler, W. | |
| dc.contributor.author | Stella, R. | |
| dc.contributor.author | Wilkening, W. | |
| dc.contributor.author | Wolf, H. | |
| dc.contributor.author | Zullino, L. | |
| dc.contributor.imecauthor | De Heyn, Vincent | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-15T17:56:20Z | |
| dc.date.available | 2021-10-15T17:56:20Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9921 | |
| dc.source.beginpage | 133 | |
| dc.source.endpage | 153 | |
| dc.source.issue | 2_3 | |
| dc.source.journal | Journal of Electrostatics | |
| dc.source.volume | 62 | |
| dc.title | Characterization and modeling of transient device behavior under CMD ESD stress | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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