Browsing by Author "Qu, S."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Characterization and modeling of transient device behavior under CDM ESD stress
Proceedings paper2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97Publication Test circuits for fast and reliable assessment of CDM robustness of I/O stages