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Conference contributions
Characterization and modeling of transient device behavior under CDM ESD stress
Publication:
Characterization and modeling of transient device behavior under CDM ESD stress
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Willemen, J.
;
Andreini, A.
;
De Heyn, Vincent
;
Esmark, K.
;
Etherton, M.
;
Gieser, H.
;
Groeseneken, Guido
;
Mettler, S.
;
Morena, E.
;
Qu, S.
;
Soppa, W.
;
Stadler, W.
;
Stella, R.
;
Wilkening, W.
;
Wolf, H.
;
Zullino, L.
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1939
since deposited on 2021-10-15
3
last month
Acq. date: 2026-01-27
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Statistics
Views
1939
since deposited on 2021-10-15
3
last month
Acq. date: 2026-01-27
Citations