Publication:
Characterization and modeling of transient device behavior under CDM ESD stress
Date
| dc.contributor.author | Willemen, J. | |
| dc.contributor.author | Andreini, A. | |
| dc.contributor.author | De Heyn, Vincent | |
| dc.contributor.author | Esmark, K. | |
| dc.contributor.author | Etherton, M. | |
| dc.contributor.author | Gieser, H. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Mettler, S. | |
| dc.contributor.author | Morena, E. | |
| dc.contributor.author | Qu, S. | |
| dc.contributor.author | Soppa, W. | |
| dc.contributor.author | Stadler, W. | |
| dc.contributor.author | Stella, R. | |
| dc.contributor.author | Wilkening, W. | |
| dc.contributor.author | Wolf, H. | |
| dc.contributor.author | Zullino, L. | |
| dc.contributor.imecauthor | De Heyn, Vincent | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-15T07:48:26Z | |
| dc.date.available | 2021-10-15T07:48:26Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8401 | |
| dc.source.beginpage | 88 | |
| dc.source.conference | Proceedings 25th EOS/ESD Symposium | |
| dc.source.conferencedate | 21/09/2003 | |
| dc.source.conferencelocation | Las Vegas, NV USA | |
| dc.source.endpage | 97 | |
| dc.title | Characterization and modeling of transient device behavior under CDM ESD stress | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |