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Browsing by Author "Rampazzo, F."

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    Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors

    Favero, D.
    ;
    De Santi, C.
    ;
    Mukherjee, K.
    ;
    Borga, Matteo  
    ;
    Geens, Karen  
    ;
    Chatterjee, Urmimala
    Journal article
    2022, MICROELECTRONICS RELIABILITY, (138) November, p.Art. 114620

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