Browsing by Author "Rampazzo, Fabiana"
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Publication Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions
Proceedings paper2012, 6th Space Agency - MOD Workshop on Wideband Gap Semiconductors and Components, 8/10/2012Publication Degradation of GaN-HEMTs with p-GaN Gate: Dependence on temperature and on geometry
Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.4B-5.1-4B-5.5Publication Impact of the Oxide Aperture Width on the Degradation of 845 Nm VCSELs for Silicon Photonics