Degradation of GaN-HEMTs with p-GaN Gate: Dependence on temperature and on geometry

Simple item page Full metadata Statistics

Files

35574.pdf 246.94 KB

Author(s)

Meneghini, Matteo

;

Rossetto, Isabella

;

;

Canato, Eleonora

;

De Santi, Carlo

;

Rampazzo, Fabiana

;

Meneghesso, Gaudenzio

;

;

Stoffels, Steve

;

Van Hove, Marleen

;

Posthuma, Niels

;

Decoutere, Stefaan

Metrics

1912 since deposited on 2021-10-24

Acq. date: 2025-10-24