Browsing by Author "Rao, V.R."
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Publication 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 2, p.180-189Publication On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Journal article2008, Applied Physics Letters, (92) 16, p.163508