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Browsing by Author "Rao, V.R."

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    Publication

    1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

    Magnone, P.
    ;
    Crupi, F.
    ;
    Giusi, G.
    ;
    Pace, C.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pantisano, Luigi
    ;
    Maji, D.
    Journal article
    2009, IEEE Transactions on Device and Materials Reliability, (9) 2, p.180-189
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    On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack

    Maji, D.
    ;
    Crupi, F.
    ;
    Giusi, G.
    ;
    Pace, C.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Rao, V.R.
    Journal article
    2008, Applied Physics Letters, (92) 16, p.163508

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