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Articles
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Publication:
1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Date
2009
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Magnone, P.
;
Crupi, F.
;
Giusi, G.
;
Pace, C.
;
Simoen, Eddy
;
Claeys, Cor
;
Pantisano, Luigi
;
Maji, D.
;
Rao, V.R.
;
Srinivasan, P.
Journal
IEEE Transactions on Device and Materials Reliability
Abstract
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2098
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
2098
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations