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Browsing by Author "Rao, V.Ramgopal"

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    Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

    Maji, D.
    ;
    Crupi, F.
    ;
    Magnone, P.
    ;
    Giusi, G.
    ;
    Pace, C.
    ;
    Simoen, Eddy  
    ;
    Rao, V.Ramgopal
    Proceedings paper
    2009, 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST, 1/06/2009

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