Publication:
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1942 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-25
Citations
Statistics
Views
1942 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-25
Citations