Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

Publication:

2009

Proceedings Paper

Author(s)

Maji, D.

;

Crupi, F.

;

Magnone, P.

;

Giusi, G.

;

Pace, C.

;

;

Rao, V.Ramgopal

1951 since deposited on 2021-10-18

2last month

Acq. date: 2026-05-16