Browsing by Author "Raskin, G."

200 mm Germanium-on-insulator(GeOI) by smart cut technology and recent GeOI MOSFETs achievements

A study of the influence of typical wet chemical treatments on the germanium wafer surface

A study of the influence of typical wet chemical treatments on the germanium wafer surface

Determination of metallic contaminants on Ge wafers using direct- and droplet sandwich etch- total reflection X-ray fluorescence spectrometry

Ge deep sub-micron pFETs with etched TaN metal gate on a High-K dielectric, fabricated in a 200mm silicon prototyping line

Germanium deep-sub micron PMOS transistors with etched TaN metal gate on a high-k dielectric, fabricated in a 200mm prototyping line

Germanium deep-submicron p-FET and n-FET devices, fabricated on germanium-on-insulator substrates

Grown-in lattice defects and diffusion in czochralski-grown germanium

Optimisation of a thin epitaxial Si layer as Ge passivation layer to demonstrate deep sub-micron n- and p-FETs on Ge-On-Insulator substrates

The future of high-k on pure germanium and its importance for Ge CMOS