Browsing by Author "Raskin, J-P"
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Publication Back-gate bias effect on UTBB-FDSOI non-linearity performance
Proceedings paper2017, 47th European Solid-State Device Research Conference - ESSDERC, 11/09/2017, p.148-151Publication Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
Proceedings paper2017, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS, 3/04/2017, p.128-131Publication Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates
Proceedings paper2021, IEEE 51st European Solid-State Device Research Conference (ESSDERC), SEP 06-09, 2021, p.303-306Publication Modeling the effect of charges in the back side passivation layer on through silicon via (TSV) capacitance after wafer thinning
Proceedings paper2015, IEEE MTT-S International Microwave Symposium - IMS, 17/05/2015, p.1-4