Browsing by Author "Ratajczak, J."
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Publication Electrical characterisation of shallow cobalt-silicided junctions
Proceedings paper2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.7-10Publication Electrical characterization of shallow cobalt-silicided junctions
Journal article2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.207-10Publication Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current
Oral presentation2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,Publication Impact of fast-neutron irradiation on the silicon P-N junction leakage and role of the diffusion reverse current
Journal article2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.166-170Publication Statistical analysis of shallow p-n junction leakage increase using XTEM results probabilities
Oral presentation2000, International Conference on Electronic Materials & European Materials Research Society Spring Meeting. Symposium M: Advanced ChaPublication Statistical analysis of shallow P-N junction leakage increase using XTEM results probabilities
Journal article2001, Materials Science in Semiconductor Processing, (4) 1_3, p.105-107