Browsing by Author "Rech, Paolo"
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Publication C-SMART: A preprocessor for neural network performance and reliability under radiation
Journal article2025, MICROELECTRONICS RELIABILITY, (173) October, p.115859Publication Neutron-induced failure in super-junction, IGBT, and SiC power devices
Proceedings paper2011, European Conference on Radiation Effects on Component and Systems - RADECS, 19/09/2011, p.226-231Publication Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays