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Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays
Publication:
Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rech, Paolo
;
Galliere, Jean-Marc
;
Girard, Patrick
;
Griffoni, Alessio
;
Wrobel, Frederic
;
Saigné, Frederic
;
Dilillo, Luigi
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1811
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Acq. date: 2025-12-16
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1811
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-16
Citations