Publication:
Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays
Date
| dc.contributor.author | Rech, Paolo | |
| dc.contributor.author | Galliere, Jean-Marc | |
| dc.contributor.author | Girard, Patrick | |
| dc.contributor.author | Griffoni, Alessio | |
| dc.contributor.author | Wrobel, Frederic | |
| dc.contributor.author | Saigné, Frederic | |
| dc.contributor.author | Dilillo, Luigi | |
| dc.date.accessioned | 2021-10-19T18:01:51Z | |
| dc.date.available | 2021-10-19T18:01:51Z | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19674 | |
| dc.source.beginpage | 274 | |
| dc.source.conference | European Conference on Radiation Effects on Component and Systems - RADECS | |
| dc.source.conferencedate | 19/09/2011 | |
| dc.source.conferencelocation | Sevilla Spain | |
| dc.source.endpage | 280 | |
| dc.title | Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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