Browsing by Author "Reid, D."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
;Duan, M. ;Zhang, J. F. ;Manut, A. ;Ji, Z. ;Zhang, W. ;Asenov, A. ;Gerrer, L. ;Reid, D.Razaidi, H.Proceedings paper2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.547-550