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Conference contributions
Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
Publication:
Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
Date
2015
Proceedings Paper
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33231.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, M.
;
Zhang, J. F.
;
Manut, A.
;
Ji, Z.
;
Zhang, W.
;
Asenov, A.
;
Gerrer, L.
;
Reid, D.
;
Razaidi, H.
;
Vigar, D.
;
Chandra, V.
;
Aitken, R.
;
Kaczer, Ben
;
Groeseneken, Guido
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Abstract
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1914
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations