Publication:

Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM

Date

2015
Proceedings Paper
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dc.contributor.authorDuan, M.
dc.contributor.authorZhang, J. F.
dc.contributor.authorManut, A.
dc.contributor.authorJi, Z.
dc.contributor.authorZhang, W.
dc.contributor.authorAsenov, A.
dc.contributor.authorGerrer, L.
dc.contributor.authorReid, D.
dc.contributor.authorRazaidi, H.
dc.contributor.authorVigar, D.
dc.contributor.authorChandra, V.
dc.contributor.authorAitken, R.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T19:06:52Z
dc.date.available2021-10-22T19:06:52Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25231
dc.source.beginpage547
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2015
dc.source.conferencelocationWashington, D.C. USA
dc.source.endpage550
dc.title

Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM

dc.typeProceedings paper
dspace.entity.typePublication
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