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Browsing by Author "Reyhaneh, Mahlouji"

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    Demonstration of an InGaAs gate stack with sufficient PBTI reliability by thermal budget optimization, nitridation, high-k material choice, and interface dipole

    Franco, Jacopo  
    ;
    Vais, Abhitosh  
    ;
    Sioncke, Sonja
    ;
    Putcha, Vamsi  
    ;
    Kaczer, Ben  
    ;
    Shie, Bo-Shiuan
    Proceedings paper
    2016, IEEE Symposium on VLSI Technology, 13/06/2016, p.42-43

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