Browsing by Author "Reynders, K."

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Effect of the n+-sinker in self-triggered bipolar ESD protection structures

De Heyn, Vincent
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Mahadeva Iyer, Natarajan
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Groeseneken, Guido
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Reynders, K.
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Moens, P.
Proceedings paper
2002, Proceedings 24th EOS/ESD Symposium, 6/10/2002, p.274-280
Future trends in intelligent interface technologies for 42V battery automotive applications

Moens, P.
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Bolognesi, D.
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Delobel, L.
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Villanueva, D.
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Reynders, K.
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Lowe, A.
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Van Herzeele, G.
Proceedings paper
2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.287-290
Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.
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Esmark, K.
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Reynders, K.
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Zubeidat, M.
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Graf, M.
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Wilkening, W.
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Willemen, J.
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Qu, D.
Journal article
2005, Microelectronics Reliability, (45) 2, p.269-277
Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Stadler, Wolfgang
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Esmark, K.
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Reynders, K.
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Zuhbeidat, M.
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Graf, M.
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Wilkening, W.
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Willemen, J.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.319-327