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Browsing by Author "Robbins, D.J."

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    FEG-TEM analysis of the effects of Ge segregation and germane flux on the Ge profile across nm-scale SiGe layers, grown by both MBE and CVD

    Benedetti, Alessandro
    ;
    Norris, D.J.
    ;
    Hetherington, C.J.D.
    ;
    Cullis, A.G.
    ;
    Robbins, D.J.
    Proceedings paper
    2003, Microscopy of Semiconducting Materials XIII, 31/03/2003, p.151-154

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