Browsing by Author "Robbins, D.J."
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Publication FEG-TEM analysis of the effects of Ge segregation and germane flux on the Ge profile across nm-scale SiGe layers, grown by both MBE and CVD
;Benedetti, Alessandro ;Norris, D.J. ;Hetherington, C.J.D. ;Cullis, A.G.Robbins, D.J.Proceedings paper2003, Microscopy of Semiconducting Materials XIII, 31/03/2003, p.151-154