Browsing by Author "Robinson, Colin"
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Publication Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations
Journal article2011-05, IEEE Transactions on Electron Devices, (58) 5, p.1344-1351Publication Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Journal article2014, Microelectronics Reliability, (54) 9_10, p.2258-2261Publication Read and pass disturbance in the programmed states of floating gate Flash memory cells with high- $j inter-poly gate dielectric stacks
Journal article2013-07, IEEE Transactions on Electron Devices, (60) 7, p.2261-2267