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Browsing by Author "Roca, E."

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    A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array

    Santana-Andreo, A.
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    Saraza Canflanca, Pablo  
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    Carrasco-Lopez, H.
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    Castro-Lopez, R.
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    Roca, E.
    Proceedings paper
    2023, 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023-07-03
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    A Ring-Oscillator-based Odometer to Unveil the Actual IC Usage Time

    de los Santos-Prieto, F.
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    Diaz Fortuny, Javier  
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    Castro-Lopez, R.
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    Roca, E.
    ;
    Fernandez, F. V.  
    Proceedings paper
    2025, IEEE International Symposium on Circuits and Systems (ISCAS), 2025-05-25
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    A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies

    Saraza-Canflanca, P.
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    Carrasco-Lopez, H.
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    Santana-Andreo, A.
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    Diaz Fortuny, Javier  
    Proceedings paper
    2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022
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    A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation

    Saraza Canflanca, Pablo  
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    Martin-Martinez, J.
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    Roca, E.
    ;
    Castro-Lopez, R.
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    Rodriguez, R.
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    Nafria, M.
    Proceedings paper
    2022, 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022-06-12
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    Parametric macromodeling of integrated inductors for RF circuit design

    Passos, F.
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    Ye, Y.
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    Roca, E.
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    Castro-Lopez, R.
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    Dhaene, Tom  
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    Fernandez, F. V.
    Journal article
    2017-05, Microwave and Optical Technology Letters, (59) 5, p.1207-1212
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    Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging

    Santana-Andreo, A.
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    Saraza Canflanca, Pablo  
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    Castro-Lopez, R.
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    Roca, E.
    ;
    Fernandez, F. V.
    Journal article
    2024-01-20, AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 176, p.155147
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    Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

    Fernandez, F. V.  
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    Roca, E.
    ;
    Saraza Canflanca, Pablo  
    ;
    Martin-Martinez, J.
    ;
    Rodriguez, R.
    ;
    Nafria, M.  
    Proceedings paper
    2023, 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023-07-03

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