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Browsing by Author "Roozeboom, Fred"

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    Materials and electrical characterization of metal gate electrodes on high-k dielectrics for advanced CMOS technologies

    Hooker, Jacob
    ;
    Lander, Rob
    ;
    Rittersma, Chris
    ;
    Schram, Tom  
    ;
    Lujan, Guilherme
    ;
    van Zijl, Jeroen
    Proceedings paper
    2002, Extended Abstracts of the 2002 International Conference on Solid State Devices and Materials - SSDM, 17/09/2002, p.174-175

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