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Browsing by Author "Rott, Gunnar"

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    Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities

    Jech, Markus
    ;
    Rott, Gunnar
    ;
    Reisinger, Hans
    ;
    Tyaginov, Stanislav  
    ;
    Rzepa, Gerhard
    Journal article
    2020, IEEE Transactions on Electron Devices, (67) 8, p.3315-3322

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