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Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities
Publication:
Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities
Date
2020
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jech, Markus
;
Rott, Gunnar
;
Reisinger, Hans
;
Tyaginov, Stanislav
;
Rzepa, Gerhard
;
Grill, Alexander
;
Jabs, Dominic
;
Jungemann, Christoph
;
Waltl, Michael
;
Grasser, Tibor
Journal
IEEE Transactions on Electron Devices
Abstract
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1998
since deposited on 2021-10-28
Acq. date: 2025-10-23
Citations
Metrics
Views
1998
since deposited on 2021-10-28
Acq. date: 2025-10-23
Citations