Browsing by Author "Routoure, J.-M."
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Publication Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Proceedings paper2011, 21st International Conference on Noise and Fluctuations - ICNF, 12/06/2011, p.131-134Publication High-temperature characterization of advanced strained nMUGFETs
; ; Publication Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
; ; ; Journal article2008, Solid-State Electronics, (52) 12, p.1889-1894Publication Low frequency noise characterization in n-channel FinFETs
Journal article2012, Solid-State Electronics, (70) 1, p.20-26