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Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
Publication:
Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Guo, Wei
;
Cretu, B.
;
Routoure, J.-M.
;
Carin, R.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
Collaert, Nadine
;
Put, Sofie
;
Claeys, Cor
Journal
Solid-State Electronics
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1918
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations
Metrics
Views
1918
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations