Publication:
Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
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1919 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-09
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Metrics
Views
1919 since deposited on 2021-10-17
1last month
Acq. date: 2026-01-09
Citations