Browsing by Author "Rouviere, Jean-Luc"
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Publication Polarity Inversions in AlN Films on Sapphire Exploiting Silicon and Oxygen Diffusion during High-Temperature Annealing
Journal article2025, CRYSTAL GROWTH & DESIGN, (25) 15, p.5697-5708Publication Transistor strain measurement techniques and their applications
Book chapter2017, Metrology and Diagnostic Techniques for Nanoelectronics