Browsing by Author "Royer Del Barrio, Pablo"
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Publication Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm
Proceedings paper2013, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 3/09/2013, p.204-207Publication SRAM scalability assessment in view of variability: a technology perspective
Oral presentation2012, Workshop on Variability Modelling and Mitigation Techniques in Current and Future Ttechnologies, in conjunction with DATEPublication TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
Proceedings paper2013, 50th ACM/EDAC/IEEE Design Automation Conference - DAC, 2/06/2013