Publication:

Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1886 since deposited on 2021-10-21
Acq. date: 2026-01-07

Citations

Metrics

Views

1886 since deposited on 2021-10-21
Acq. date: 2026-01-07

Citations