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Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm
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Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm
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Date
2013
Proceedings Paper
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25833.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Royer Del Barrio, Pablo
;
Zuber, Paul
;
Cheng, Binjie
;
Asenov, Asen
;
Lopez-Vallejo, M.
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1886
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Acq. date: 2025-12-13
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Metrics
Views
1886
since deposited on 2021-10-21
4
last month
Acq. date: 2025-12-13
Citations