Browsing by Author "Rupp, K."
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Publication Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
;Grasser, T. ;Stampfer, B. ;Waltl, M. ;Rzepa, G. ;Rupp, K. ;Schanovsky, F.Pobegen, G.Proceedings paper2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 13/03/2018, p.2A.2-1-2A.2-10