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Browsing by Author "Rupp, K."

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    Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors

    Grasser, T.
    ;
    Stampfer, B.
    ;
    Waltl, M.
    ;
    Rzepa, G.
    ;
    Rupp, K.
    ;
    Schanovsky, F.
    ;
    Pobegen, G.
    Proceedings paper
    2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 13/03/2018, p.2A.2-1-2A.2-10

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