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Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
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1892 since deposited on 2021-10-25
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Acq. date: 2025-12-11
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1892 since deposited on 2021-10-25
1last month
1last week
Acq. date: 2025-12-11
Citations