Browsing by Author "Saks, N. S."
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Publication Charge Pumping at a Single Interface Trap
Oral presentation1995, 26th IEEE Semiconductor Interface Specialists' Conference; December 7-9, 1995; Charleston, South Carolina, USA.Publication Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
Journal article1994, J. Appl. Phys., 75, p.2073-2080