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Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
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Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van den bosch, G.
;
Groeseneken, Guido
;
Maes, Herman
;
Klein, R.
;
Saks, N. S.
Journal
J. Appl. Phys.
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2063
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
2063
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-10
Citations