Publication:
Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
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2065 since deposited on 2021-09-29
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Acq. date: 2026-02-24
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Statistics
Views
2065 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-02-24
Citations