Publication:
Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
Date
| dc.contributor.author | Van den bosch, G. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.author | Klein, R. | |
| dc.contributor.author | Saks, N. S. | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T12:49:20Z | |
| dc.date.available | 2021-09-29T12:49:20Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/387 | |
| dc.source.beginpage | 2073 | |
| dc.source.endpage | 2080 | |
| dc.source.journal | J. Appl. Phys. | |
| dc.source.volume | 75 | |
| dc.title | Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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