Browsing by Author "Samsel, I.K."

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Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs

Zhang, E.X.
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Samsel, I.K.
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Hooten, N.C.
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Bennett, W.G.
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Funkhouser, E.D.
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Kai, N.
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Ball, D.R.
Proceedings paper
2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/07/2014, p.PE-4
Heavy ion and laser-induced transients in SiGe channel pMOSFETs

Zhang, E.X.
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Samsel, I.K.
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Bennett, W.G.
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Hooten, N.C.
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McCurdy, M.
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Fleetwood, D.M.
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Reed, R.A.
Proceedings paper
2013, International Semiconductors Device Research Symposium, 11/12/2013, p.FA7-03
Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain

Wang, L.
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Zhang, E.X.
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Zhang, C.X.
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Duan, G.X.
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Schrimpf, R.D.
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Fleetwood, D.M.
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Reed, R.A.
Proceedings paper
2015, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 13/07/2015, p.22-25