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Browsing by Author "San Andres, Enrico"

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    Reliability of strained-Si devices with post-oxide-deposition strain introduction

    Shickova, Adelina
    ;
    Verheyen, Peter  
    ;
    Eneman, Geert  
    ;
    Degraeve, Robin  
    ;
    Simoen, Eddy  
    ;
    Favia, Paola  
    Journal article
    2008, IEEE Transactions on Electron Devices, (55) 12, p.3432-3441

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