Publication:

Reliability of strained-Si devices with post-oxide-deposition strain introduction

Date

2008

Journal article

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Files

16761.pdf 496.58 KB

Author(s)

Shickova, Adelina

;

Verheyen, Peter

;

;

Degraeve, Robin

;

;

;

;

San Andres, Enrico

;

;

;

Absil, Philippe

;

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Statistics

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Acq. date: 2026-02-24