Reliability of strained-Si devices with post-oxide-deposition strain introduction

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Author(s)

Shickova, Adelina

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Verheyen, Peter

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Degraeve, Robin

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San Andres, Enrico

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Absil, Philippe

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

1946 since deposited on 2021-10-17

5last month

Acq. date: 2025-12-08