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Browsing by Author "Saraswat, K.C."

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    Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs

    Lin, Dennis  
    ;
    Alian, AliReza  
    ;
    Gupta, S.
    ;
    Yang, B.
    ;
    Bury, Erik  
    ;
    Sioncke, Sonja
    ;
    Degraeve, Robin  
    Proceedings paper
    2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.28.3
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    GeSn channel nMOSFETs: material potential and technological outlook

    Gupta, Somya
    ;
    Vincent, Benjamin  
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    Lin, Dennis  
    ;
    Gunji, M.
    ;
    Firrincieli, Andrea  
    Proceedings paper
    2012, Symposium on VLSI Technology, 12/06/2012, p.95-96

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