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Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Publication:
Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Date
2012
Proceedings Paper
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25230.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lin, Dennis
;
Alian, AliReza
;
Gupta, S.
;
Yang, B.
;
Bury, Erik
;
Sioncke, Sonja
;
Degraeve, Robin
;
Toledano Luque, Maria
;
Krom, Raymond
;
Favia, Paola
;
Bender, Hugo
;
Caymax, Matty
;
Saraswat, K.C.
;
Collaert, Nadine
;
Thean, Aaron
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1938
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1938
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations