Browsing by Author "Scarrozza, Marco"

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Scarrozza, Marco

Journal article

2011, Surface Science, (605) 19_20, p.1778-1783

Publication

First-principles simulations of the oxidation of the GaAs(001)-beta2(2x4) surface

Scarrozza, Marco

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Oral presentation

2008, 39th IEEE Semiconductor Interface Specialists Conference

Publication

Ge and III/V devices for advanced CMOS

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Adelmann, Christoph

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Brunco, David

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De Jaeger, Brice

Proceedings paper

2009, 10th International Conference on Ultimate Integration of Silicon - ULIS, 18/03/2009, p.83-86

Publication

Ge and III/V devices on Si for advanced CMOS

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Bellenger, Florence

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Meeting abstract

2009, 5th Handai Nanoscience and Nanotechnology International Symposium, 1/09/2009

Publication

Ge and III/V: the CMOS of the future

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Adelmann, Christoph

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Bellenger, Florence

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Brunco, David

Oral presentation

2007, 38th Semiconductor Interface Specialists Conference - SISC

Publication

High mobility channel materials and novel devices for scaling of nanoelectronics beyond the Si roadmap

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Bellenger, Florence

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Proceedings paper

2009, High-k Dielectrics on Semiconductors with High Carrier Mobility, 30/11/2009, p.1194-A07-01

Publication

High-k dielectrics and interface passivation for Ge and III/V devices on silicon for advanced CMOS

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Bellenger, Florence

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De Jaeger, Brice

Proceedings paper

2009, High Dielectric Constant Materials and Gate Stacks 7, 4/10/2009, p.51-65

Publication

High-k dielectrics and interface passivation for Ge and III/V devices on silicon for advanced CMOS

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Meeting abstract

2009, 216th ECS Meeting, 4/10/2009, p.2109

Publication

Interfaces of high-k dielectrics on GaAs: their common features and the relationship with Fermi level pinning

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Delabie, Annelies

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Sioncke, Sonja

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Lin, Dennis

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Scarrozza, Marco

Journal article

2009, Microelectronic Engineering, (86) 7_9, p.1529-1535

Publication

Molecular Beam Epitaxy study of a common a-GeO2 interfacial passivation layer for Ge- and GaAs-based MOS heterostructures

Merckling, Clement

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Penaud, Julien

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Bellenger, Florence

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Kohen, David

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Proceedings paper

2009, CMOS Gate Stack Scaling. Materials, Interfaces, and Reliability, 13/04/2009, p.C06.07

Publication

Oxidation of the GaAs(001) surface: Insights from first-principles calculations

Scarrozza, Marco

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Journal article

2012, Physical Review B, (85) 19, p.195307

Publication

Scaling of nanoelectronics beyond the Si roadmap

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Bellenger, Florence

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Cantoro, Mirco

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Meeting abstract

2009, 1st International Workshop on Si based Nano-Electronics and -Photonics, 20/09/2009

Publication

Shaping the future of nanoelectronics beyond the Si roadmap with new materials and devices

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Bellenger, Florence

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Cantoro, Mirco

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