Browsing by Author "Schömann, S."

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High-resolution scanning spreading resistance microscopy of surrounding-gate transistors

Alvarez, D.
;
Schömann, S.
;
Goebel, B.
;
Manger, D.
;
Schlösser, T.
;
Slesazeck, S.
;
Hartwich, J.
;
Kretz, J.
Journal article
2004-01, Journal of Vacuum Science and Technology B, (22) 1, p.377-380
New trends in the application of scanning probe techniques in failure analysis

Schweinbock, T.
;
Schömann, S.
;
Alvarez, David
;
Buzzo, M.
;
Frammelsberger, W.
;
Breitschopf, P.
Journal article
2004, Microelectronics Reliability, (44) 9_11, p.1541-1546