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    A comprehensive model for correlated drain and gate current fluctuations

    Goes, Wolfgang
    ;
    Toledano Luque, Maria
    ;
    Baumgartner, O.
    ;
    Schanovsky, Frank
    ;
    Kaczer, Ben  
    Proceedings paper
    2013, 16th International Workshop on Computational Electronics - IWCE, 4/06/2013, p.46-47

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