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A comprehensive model for correlated drain and gate current fluctuations
Publication:
A comprehensive model for correlated drain and gate current fluctuations
Date
2013
Proceedings Paper
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26746.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goes, Wolfgang
;
Toledano Luque, Maria
;
Baumgartner, O.
;
Schanovsky, Frank
;
Kaczer, Ben
;
Grasser, Tibor
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1909
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
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Views
1909
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations