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Browsing by Author "Schauer, P."

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    Noise and THI reliability indicators for thin film resistors

    Sikula, J.
    ;
    Hruska, P.
    ;
    Vasina, Petr
    ;
    Schauer, P.
    ;
    Kolarova, R.
    ;
    Hajek, K.
    ;
    Stadalnikas, A.
    Proceedings paper
    1996, Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium, 7/10/1996, p.200-205

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